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Polimat: Research and development equipment | Auxiliaries and accessories for AFM microscopy
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Atomic force microscope (AFM-XE-100)


Equipment type:  Atomic force microscope - AFM upgrade with additional acoustic enclosure and XY-stage controller

Manufacturer / Brand: PARK

Model: XE-100

Scope of usage: 

  • Non-contact topography AFM (NC-AFM)
  • Contact topography AFM (C-AFM)
  • Nano-measurement of surface energy 

Examples of application for polymer analysis / information that can be obtained by this method for polymers: 

  • particles shapes and sizes in range 1nm - 2µm 
  • Topography of surfaces in sizes up to 40 x 40µm 
  • Nano-measurement of surface energy 

Measurement range: 

Sample limitations:  

  • Diameter of samples up to 1.5cm 
  • Sample in liquid or solid state - measurements/topography only on solid samples

Limitation of application conditions:  Normal conditions (T = approx. 25°C, p =  ca. 1atm)





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